Refined tip preparation by electrochemical etching and ultrahigh vacuum treatment to obtain atomically sharp tips for scanning tunneling microscope and atomic force microscope

✍ Scribed by Hagedorn, Till; Ouali, Mehdi El; Paul, William; Oliver, David; Miyahara, Yoichi; Grütter, Peter

• Book ID: 120999023
• Publisher: American Institute of Physics
• Year: 2011
• Tongue: English
• Weight: 871 KB
• Volume: 82
• Category: Article
• ISSN: 0034-6748
• DOI: 10.1063/1.3660279