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Reference Sample Method Reduces the Error Caused by Variable Cryosection Thickness in Fourier Transform Infrared Imaging

✍ Scribed by Rieppo, Jarno; Hyttinen, Mika M.; Jurvelin, Jukka S.; Helminen, Heikki J.


Book ID
115365100
Publisher
Society for Applied Spectroscopy
Year
2004
Tongue
English
Weight
242 KB
Volume
58
Category
Article
ISSN
0003-7028

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