✦ LIBER ✦
Reed switch reliability : R. K. Saraf and Ivan B. Ram. Microelectron. Reliab.17, 431 (1978)
- Publisher
- Elsevier Science
- Year
- 1978
- Tongue
- English
- Weight
- 124 KB
- Volume
- 18
- Category
- Article
- ISSN
- 0026-2714
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