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Reduction of CuO-containing catalysts, CuO: II, XRD and XPS

✍ Scribed by Boyce, A. L. ;Graville, S. R. ;Sermon, P. A. ;Vong, M. S. W.

Book ID
112685357
Publisher
Springer
Year
1991
Tongue
English
Weight
182 KB
Volume
44
Category
Article
ISSN
0133-1736

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Using XPS and x-ray-excited Auger electron spectroscopy (XAES), we have studied the variation in surface composition of CUO and Cu,O with a variety of high-vacuum treatments, including vacuum annealing, oxidation and hydrogen reduction. Prolonged annealing of CuO results in the formation of a thick