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Reducing thickness dependence of critical current density in GdBa2Cu3O7−δ thin films by addition of nanostructured defects

✍ Scribed by Tran, D. H.; Putri, W. B. K.; Kang, B.; Lee, N. H.; Kang, W. N.; Seong, W. K.


Book ID
126271325
Publisher
American Institute of Physics
Year
2013
Tongue
English
Weight
663 KB
Volume
113
Category
Article
ISSN
0021-8979

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