✦ LIBER ✦
Reducing Test Time in the High-Volume Production of Analog Circuits using Efficient Test-Vector Generation and Interpolation Techniques
✍ Scribed by Mustapha Slamani; Karim Arabi
- Book ID
- 110316319
- Publisher
- Springer US
- Year
- 2001
- Tongue
- English
- Weight
- 106 KB
- Volume
- 17
- Category
- Article
- ISSN
- 0923-8174
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