Reducing test-data volume using P-testable scan chains in circuits with multiple scan chains

✍ Scribed by Pomeranz, I.

• Book ID: 117907235
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 574 KB
• Volume: 23
• Category: Article
• ISSN: 0278-0070
• DOI: 10.1109/tcad.2004.835131