Reducing Post-Trim Drift of Thin-Film Resistors by Optimizing YAG Laser Output Characteristics

✍ Scribed by Dow, R.; Mauck, M.; Richardson, T.; Swenson, E.

• Book ID: 117911210
• Publisher: IEEE
• Year: 1978
• Tongue: English
• Weight: 1014 KB
• Volume: 1
• Category: Article
• ISSN: 0148-6411
• DOI: 10.1109/tchmt.1978.1135306