Reducing burn-in time through high-voltage stress test and Weibull statistical analysis

✍ Scribed by Zakaria, M.F.; Kassim, Z.A.; Ooi, M.P.-L.; Demidenko, S.

• Book ID: 119807218
• Publisher: IEEE
• Year: 2006
• Tongue: English
• Weight: 170 KB
• Volume: 23
• Category: Article
• ISSN: 0740-7475
• DOI: 10.1109/mdt.2006.50