𝔖 Bobbio Scriptorium
✦   LIBER   ✦

Recovery study of negative bias temperature instability

✍ Scribed by Miaomiao Wang; Sufi Zafar; James H. Stathis


Book ID
104052305
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
379 KB
Volume
86
Category
Article
ISSN
0167-9317

No coin nor oath required. For personal study only.


πŸ“œ SIMILAR VOLUMES


Degradation dynamics, recovery, and char
✍ M. Ershov; S. Saxena; S. Minehane; P. Clifton; M. Redford; R. Lindley; H. Karbas πŸ“‚ Article πŸ“… 2005 πŸ› Elsevier Science 🌐 English βš– 365 KB

This article describes several deficiencies with traditional assessments of negative bias temperature instability (NBTI) in pMOS transistors and proposes methods for handling them. These effects include: (a) a decrease in the rate of degradation over time, (b) a deviation of the stress bias dependen