Recombination processes controlling the carrier lifetime in n[sup −]4H–SiC epilayers with low Z[sub 1/2] concentrations

✍ Scribed by Klein, P. B.; Myers-Ward, R.; Lew, K.-K.; VanMil, B. L.; Eddy, C. R.; Gaskill, D. K.; Shrivastava, A.; Sudarshan, T. S.

• Book ID: 121345145
• Publisher: American Institute of Physics
• Year: 2010
• Tongue: English
• Weight: 515 KB
• Volume: 108
• Category: Article
• ISSN: 0021-8979
• DOI: 10.1063/1.3466745