Recombination lifetime characterization and mapping of silicon wafers and detectors using the microwave photoconductivity decay (μPCD) technique

✍ Scribed by J. Härkönen; E. Tuovinen; Z. Li; P. Luukka; E. Verbitskaya; V. Eremin

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 125 KB
• Volume: 9
• Category: Article
• ISSN: 1369-8001
• DOI: 10.1016/j.mssp.2006.01.049