Recombination centers identification in very thin silicon epitaxial layers via lifetime measurements

✍ Scribed by S. Daliento; A. Sanseverino; P. Spirito; P. Sarro; L. Zeni

• Book ID: 126615926
• Publisher: IEEE
• Year: 1996
• Tongue: English
• Weight: 301 KB
• Volume: 17
• Category: Article
• ISSN: 0741-3106
• DOI: 10.1109/55.485196