Effective recognition of control chart patterns (CCPs) is an important issue since abnormal patterns exhibited in control charts can be associated with certain assignable causes which affect the process. Most of the existing studies assume that the observed process data which needs to be recognized
Recognizing facial action units using independent component analysis and support vector machine
โ Scribed by Chao-Fa Chuang; Frank Y. Shih
- Publisher
- Elsevier Science
- Year
- 2006
- Tongue
- English
- Weight
- 277 KB
- Volume
- 39
- Category
- Article
- ISSN
- 0031-3203
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