Recent improvements in the integration of field emitters into scanning probe microscopy sensors

✍ Scribed by S. Beuer; M. Rommel; S. Petersen; B. Amon; Th. Sulzbach; W. Engl; A.J. Bauer; H. Ryssel

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 560 KB
• Volume: 85
• Category: Article
• ISSN: 0167-9317
• DOI: 10.1016/j.mee.2008.01.048