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Recent developments in BIPM voltage standard comparisons

✍ Scribed by Reymann, D.; Witt, T.J.; Vrabcek, P.; Yi-Hua Tang; Hamilton, C.A.; Katkov, A.S.; Jeanneret, B.; Power, O.

Book ID: 114544797
Publisher: IEEE
Year: 2001
Tongue: English
Weight: 83 KB
Volume: 50
Category: Article
ISSN: 0018-9456
DOI: 10.1109/19.918103

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