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Recent advances on kinetic analysis of electromigration enhanced intermetallic growth and damage formation in Pb-free solder joints

✍ Scribed by Brook Huang-Lin Chao; Xuefeng Zhang; Seung-Hyun Chae; Paul S. Ho


Book ID
108210797
Publisher
Elsevier Science
Year
2009
Tongue
English
Weight
957 KB
Volume
49
Category
Article
ISSN
0026-2714

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