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Real-time observation of the phase transformations and microstructural changes during the incorporation of In into a thin Cu film at 770K

✍ Scribed by Rodriguez-Alvarez, H.; Weber, A.; Mainz, R.; Klaus, M.; Kaufmann, C.A.; Rissom, T.; Genzel, C.; Schock, H.-W.


Book ID
122203139
Publisher
Elsevier Science
Year
2014
Tongue
English
Weight
891 KB
Volume
588
Category
Article
ISSN
0925-8388

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