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Real Time Observation of the Directional Solidification of Multicrystalline Silicon: X-ray Imaging Characterization

✍ Scribed by A. Tandjaoui; N. Mangelinck-Noël; G. Reinhart; J-J. Furter; B. Billia; T. Lafford; J. Baruchel; X. Guichard

No coin nor oath required. For personal study only.

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