Real Time Investigation of the Interface
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Hyo Jung Kim; Hyun Hwi Lee; Jang-Joo Kim
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Article
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2009
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John Wiley and Sons
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English
⚖ 311 KB
## Abstract Real time variation of the interfacial structure between an Al electrode and a poly(3‐hexylthiophene) (P3HT):fullerene (PCBM) thin film during thermal annealing has been investigated using synchrotron X‐rays. It is found that Al atoms diffuse into the organic layer to form a thin interl