✦ LIBER ✦
Real structure effects in X-ray waveguide optics: The influence of interfacial roughness and refractive index profile on the near-field and far-field distribution
✍ Scribed by Markus Osterhoff; Tim Salditt
- Publisher
- Elsevier Science
- Year
- 2009
- Tongue
- English
- Weight
- 688 KB
- Volume
- 282
- Category
- Article
- ISSN
- 0030-4018
No coin nor oath required. For personal study only.