Real impact of dynamic operation stress during burn-in on DRAM retention time

✍ Scribed by Il-Gweon Kim; Se-Kyeong Choi; Jin-Hyeok Choi; Joo-Seog Park

• Book ID: 114617396
• Publisher: IEEE
• Year: 2004
• Tongue: English
• Weight: 351 KB
• Volume: 51
• Category: Article
• ISSN: 0018-9383
• DOI: 10.1109/ted.2004.825114