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Read-disturb and endurance of SSI-flash E2PROM devices at high operating temperatures

โœ Scribed by De Blauwe, J.; Wellekens, D.; Groeseneken, G.; Haspeslagh, L.; Van Houdt, J.; Deferm, L.; Maes, H.E.

Book ID
114537497
Publisher
IEEE
Year
1998
Tongue
English
Weight
270 KB
Volume
45
Category
Article
ISSN
0018-9383

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