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Reactive ion etching of submicron MoSi2/poly-Si gates for CMOS/SOS devices : Eugene C. Whitcomb and A. B. Jones. Solid St. Technol., 121 (April 1982)


Publisher
Elsevier Science
Year
1983
Tongue
English
Weight
63 KB
Volume
23
Category
Article
ISSN
0026-2714

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