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Reaction pathways and sources of OH groups in low temperature remote PECVD silicon dioxide thin films

✍ Scribed by J. A. Theil; D. V. Tsu; G. Lucovsky


Book ID
112812111
Publisher
Springer US
Year
1990
Tongue
English
Weight
892 KB
Volume
19
Category
Article
ISSN
0361-5235

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