Reaction kinetics of cerium thin films with H2, O2 and H2O systems at 298 K
โ Scribed by M Hadano; N Urushihara; S Terada; D Katsuya; H Uchida
- Book ID
- 117620367
- Publisher
- Elsevier Science
- Year
- 2002
- Tongue
- English
- Weight
- 199 KB
- Volume
- 330-332
- Category
- Article
- ISSN
- 0925-8388
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๐ SIMILAR VOLUMES
The rate constants for the reactions OH(X 'II, kl k2 u=O) + NH3 --t HzO+ NH? and OII(X '11, u=O) + O3 -HO, + O2 were measured at 296K by the flash photolysis resonance fluorescence technique. The values of the rate constants thus obtained are kl = (4.1 +-0.6) X lo-l4 nndkz = (6.5 t 1.0) X lo-l4 in u
The kinetics of CzH50 and CzH502 radicals with NO have been studied at 298 K using the discharge flow technique coupled to laser induced fluorescence (LIF) and mass spectrometry analysis. The temporal profiles of CzH5O were monitored by LIF. The rate constant for CzH5O + NO -Products (21, measured i