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RBS-channeling spectra: simulation of as-implanted Si samples through an empirical formula for 〈100〉 axial dechanneling of He in silicon

✍ Scribed by M. Bianconi; R. Nipoti; M. Cantiano; A. Gasparotto; A. Sambo


Book ID
113285407
Publisher
Elsevier Science
Year
1994
Tongue
English
Weight
460 KB
Volume
84
Category
Article
ISSN
0168-583X

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