RBS and XRD analysis of SiGe/Ge heterostructures for p-HMOS applications

✍ Scribed by N. Franco; E. Alves; A. Vallêra; R.J.H. Morris; O.A. Mironov; E.H.C. Parker; N.P. Barradas

• Publisher: Elsevier Science
• Year: 2006
• Tongue: English
• Weight: 208 KB
• Volume: 249
• Category: Article
• ISSN: 0168-583X
• DOI: 10.1016/j.nimb.2006.03.155