-ray-induced intrinsic defect processes in fluorine-doped synthetic SiO2 glasses of different fluorine concentrations

✍ Scribed by Koichi Kajihara; Masahiro Hirano; Linards Skuja; Hideo Hosono

• Publisher: Elsevier Science
• Year: 2009
• Tongue: English
• Weight: 404 KB
• Volume: 161
• Category: Article
• ISSN: 0921-5107
• DOI: 10.1016/j.mseb.2008.11.002