✦ LIBER ✦
Rapid Thermal Annealing Induced Deep Level Defects in Te-Doped GaAs
✍ Scribed by Reddy, C. V. ;Fung, S. ;Beling, C. D.
- Publisher
- John Wiley and Sons
- Year
- 1998
- Tongue
- English
- Weight
- 259 KB
- Volume
- 168
- Category
- Article
- ISSN
- 0031-8965
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