✦ LIBER ✦

Rapid surface roughness measurements of silicone thin films with different thicknesses

✍ Scribed by Kuo, Chil-Chyuan; Huang, Po-Jen

No coin nor oath required. For personal study only.

📜 SIMILAR VOLUMES

Rapid optical measurement of surface rou

✍ Chil-Chyuan Kuo; Chin-Sheng Chao 📂 Article 📅 2010 🏛 Elsevier Science 🌐 English ⚖ 516 KB

Surface roughness measurements of CaF2 t

✍ G.H. Ames; D.G. Hall; A.J. Braundmeier Jr. 📂 Article 📅 1982 🏛 Elsevier Science 🌐 English ⚖ 262 KB

Luminescent method for measuring the thi

✍ S. A. Sukhov; V. V. Litovchenko 📂 Article 📅 1967 🏛 Springer US 🌐 English ⚖ 245 KB

Ellipsometry of thin silicon dioxide fil

✍ T. David Burleigh; Sigurd Wagner; Theodore F. Ciszek 📂 Article 📅 1980 🏛 Elsevier Science ⚖ 51 KB

Microstructures of BPDA-PPD polyimide th

✍ Kotera, Masaru; Samyul, Boo; Araie, Kouhei; Sugioka, Yuri; Nishino, Takashi; Maj 📂 Article 📅 2013 🏛 Elsevier Science 🌐 English ⚖ 743 KB

Surface roughness characterization of Al

✍ Chil-Chyuan Kuo 📂 Article 📅 2011 🏛 Elsevier Science 🌐 English ⚖ 559 KB