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Rapid-scan Fourier transform spectroscopy of 2-D space charge layers in semiconductors

✍ Scribed by E. Batke; D. Heitmann

Publisher: Elsevier Science
Year: 1984
Weight: 683 KB
Volume: 24
Category: Article
ISSN: 0020-0891
DOI: 10.1016/0020-0891(84)90069-1

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