Rapid integrated-circuit reliability simulation and its application to testing : Ken Kubiak and W. Kent Fuchs. IEEE Transactions on Reliability, 41 (3), 458 (1992)

• Book ID: 103284655
• Publisher: Elsevier Science
• Year: 1993
• Tongue: English
• Weight: 113 KB
• Volume: 33
• Category: Article
• ISSN: 0026-2714
• DOI: 10.1016/0026-2714(93)90368-9