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Rapid flaw depth estimation from SQUID-based eddy current nondestructive evaluation

✍ Scribed by M. Pattabiraman; R. Nagendran; M.P. Janawadkar


Book ID
108218618
Publisher
Elsevier Science
Year
2007
Tongue
English
Weight
659 KB
Volume
40
Category
Article
ISSN
0963-8695

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