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Rapid evaluation of dislocation densities in n-type GaN films using photoenhanced wet etching

✍ Scribed by Youtsey, C.; Romano, L. T.; Molnar, R. J.; Adesida, I.


Book ID
127151412
Publisher
American Institute of Physics
Year
1999
Tongue
English
Weight
479 KB
Volume
74
Category
Article
ISSN
0003-6951

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