Rapid determination of residual stress profiles in ferrite phase of cold-drawn wire by XRD and layer removal technique

✍ Scribed by F. Yang; J.Q. Jiang; F. Fang; Y. Wang; C. Ma

• Publisher: Elsevier Science
• Year: 2008
• Tongue: English
• Weight: 578 KB
• Volume: 486
• Category: Article
• ISSN: 0921-5093
• DOI: 10.1016/j.msea.2007.09.025