𝔖 Bobbio Scriptorium
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Rapid assessment of the humidity dependence of IC failure modes by use of HAST : Jeffrey E. Gunn, Robert E. Camenga and Sushil K. Malik. IEEE 21st Ann. Proc. Reliab. Phys. 66 (1983)


Book ID
103278235
Publisher
Elsevier Science
Year
1984
Tongue
English
Weight
129 KB
Volume
24
Category
Article
ISSN
0026-2714

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