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Rapid and simple measurement of critical current density in HTS thin films using a permanent magnet method

โœ Scribed by A. Saito; K. Takeishi; Y. Takano; T. Nakamura; M. Yokoo; M. Mukaida; S. Hirano; S. Ohshima


Publisher
Elsevier Science
Year
2005
Tongue
English
Weight
294 KB
Volume
426-431
Category
Article
ISSN
0921-4534

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