Rapid and accurate measurement for phase-change optical recording bits

✍ Scribed by Sy-Hann Chen

• Book ID: 102333610
• Publisher: John Wiley and Sons
• Year: 2007
• Tongue: English
• Weight: 367 KB
• Volume: 70
• Category: Article
• ISSN: 1059-910X
• DOI: 10.1002/jemt.20415

✦ Synopsis

Abstract

Conducting atomic force microscopy (CAFM) and scanning surface potential microscopy (SSPM) have been used to image the phase‐change optical recording bits. Commercially available digital versatile discs (DVD) + rewritable (RW) with initialization process were measured in experiments. Comparing the measurement results of both, the measurement resolution of CAFM is far superior to that of SSPM. With the DVD + RW disc rotating at a linear speed of 3.5 m/s, appropriate writing laser power range, may be precisely identified by CAFM as 10–15 mW. This is sufficient to verify the high‐resolution recording bits research method. This new method may also be applied to the development of new types of phase‐change recording materials. Microsc. Res. Tech., 2007. © 2007 Wiley‐Liss, Inc.