Loop-erased self-avoiding random walks i
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Bradley, R. E.; Windwer, S.
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Article
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1996
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John Wiley and Sons
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English
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Monte Carlo simulations of loop-erased self-avoiding random walks in four and five dimensions were performed, using two distinct algorithms. We find consistency between these methods in their estimates of critical exponents. The upper critical dimension for this phenomenon is four, and it has been s