✦ LIBER ✦
Random Pattern Testability of Control and Address Circuitry of an Embedded Memory with Feed-Forward Data-Path Connections
✍ Scribed by Jacob Savir
- Book ID
- 110262531
- Publisher
- Springer US
- Year
- 1999
- Tongue
- English
- Weight
- 146 KB
- Volume
- 15
- Category
- Article
- ISSN
- 0923-8174
No coin nor oath required. For personal study only.