𝔖 Bobbio Scriptorium

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Random pattern testability: J. Savir, G. Ditlow and P.H. Bardell: Rep. RC 9643, IBM T.J. Watson Research Center, Yorktown Heights, New York 10598, U.S.A., (October 1982)

Book ID: 113272558
Publisher: Elsevier Science
Year: 1985
Tongue: English
Weight: 129 KB
Volume: 1
Category: Article
ISSN: 0167-9236
DOI: 10.1016/0167-9236(85)90111-3

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