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Raman study of the mechanism of electrical switching in Cu TCNQ films

✍ Scribed by E.I. Kamitsos; C.H. Tzinis; W.M. Risen Jr.

Publisher: Elsevier Science
Year: 1982
Tongue: English
Weight: 400 KB
Volume: 42
Category: Article
ISSN: 0038-1098
DOI: 10.1016/0038-1098(82)90608-1

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