Raman spectroscopy study of Zn1−xFexSe under high pressure

✍ Scribed by Chih-Ming Lin; Der-San Chuu

• Publisher: John Wiley and Sons
• Year: 1999
• Tongue: English
• Weight: 123 KB
• Volume: 30
• Category: Article
• ISSN: 0377-0486
• DOI: 10.1002/(sici)1097-4555(199910)30:10<951::aid-jrs461>3.0.co;2-v

✦ Synopsis

Zn 1-x Fe x Se, x = 0, 0.018, 0.035 and 0.16, were studied by Raman scattering spectroscopy up to 35.0 GPa. It was found that the semiconductor-metal phase transition pressures for these samples are 14.4, 12.8, 12.0 and 10.9 GPa, respectively. Before the semiconductor-metal phase transition, a visible anomaly of the TO Raman mode splitting was observed at 4.7 and 9.1 GPa for ZnSe, at 3.3 and 5.9 GPa for Zn 0.982 Fe 0.018 Se, and at 4.5 and 7.2 GPa for Zn 0.965 Fe 0.035 Se, respectively, while Zn 0.84 Fe 0.16 Se showed mode splitting at 4.7 GPa only. For these samples, one of the TO splitting modes exhibits phonon softening (red shift), while the other manifests wavenumber increasing (blue shift) with pressure. For x = 0.018, 0.035 and 0.16, a new Raman mode, which was identified as Fe local mode, was observed between the pure ZnSe LO and TO modes. Fe local mode exhibits blue shift behaviour before metallization and disappears as the pressure is higher beyond the metallization pressure.