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Raman spectroscopic characterization of the microstructure of V2O5films

✍ Scribed by Q. Su; X. Q. Liu; H. L. Ma; Y. P. Guo; Y. Y. Wang

Publisher: Springer
Year: 2008
Tongue: English
Weight: 203 KB
Volume: 12
Category: Article
ISSN: 1432-8488
DOI: 10.1007/s10008-008-0515-5

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