Raman scattering in-depth evaluation of recrystallized silicon-on-oxide using different wavelength excitation

✍ Scribed by M. Kanamori; H. Tsuya

• Book ID: 112812345
• Publisher: Springer US
• Year: 1988
• Tongue: English
• Weight: 921 KB
• Volume: 17
• Category: Article
• ISSN: 0361-5235
• DOI: 10.1007/bf02652230