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Raman scattering as a characterization tool for epitaxial GaN thin films grown on sapphire by turbo disk metal-organic chemical vapor deposition
✍ Scribed by Feng, Zhe Chuan ;Schurman, Matthew ;Stall, Richard A. ;Pavlosky, Mark ;Whitley, Andrew
- Book ID
- 115345969
- Publisher
- The Optical Society
- Year
- 1997
- Tongue
- English
- Weight
- 263 KB
- Volume
- 36
- Category
- Article
- ISSN
- 1559-128X
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