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Raman scattering and photoluminescence analysis of SOI/SIMOX structures obtained by sequential implantation and annealing correlated with cross sectional TEM

✍ Scribed by A. Pérez; J. Portillo; A. Cornet; J. Jiménez; J.R. Morante; P.L.F. Hemment; K.P. Homewood


Book ID
113282472
Publisher
Elsevier Science
Year
1991
Tongue
English
Weight
773 KB
Volume
55
Category
Article
ISSN
0168-583X

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