Raman scattering analysis of disorder in heterogeneous (GaAs)1−x(SiC2:H)x films grown by metal-organic chemical vapour deposition

✍ Scribed by F. Maury; R. Carles; G. Landa; J.B. Renucci

• Publisher: Elsevier Science
• Year: 1987
• Tongue: English
• Weight: 597 KB
• Volume: 155
• Category: Article
• ISSN: 0040-6090
• DOI: 10.1016/0040-6090(87)90078-2