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Raman microprobe spectroscopy measurements of residual stress distribution along blisters in Cr2O3 thin films

✍ Scribed by M. Kemdehoundja; J.L. Grosseau-Poussard; J.F. Dinhut

Publisher: Elsevier Science
Year: 2010
Tongue: English
Weight: 560 KB
Volume: 256
Category: Article
ISSN: 0169-4332
DOI: 10.1016/j.apsusc.2009.11.016

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✦ Synopsis

optical microscopy after chemical treatment of about 35 mm with no preferential orientation [8]. Samples were mechanically cut (thickness: 2 mm, diameter: 12 mm) and polished to a 5 mm (SiC paper) or 1 mm (diamond paste) surface finish. Before the oxidation treatment, samples were washed in an ethanol

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